Model | MCT200 | ||
---|---|---|---|
Working Principle | Magnetic indication | Eddy currents | |
Probe type | F | N | |
Measurement rage (um) | 0-1500 | 0-1500 Chromium plating on copper 0-40 |
|
Resolution (um) | 0.1μm (0~99μm), 1μm(>99μm) | ||
Indication value | One-point calibration (um) (H is the actual thickness of the measurement object) | +(3%H+1) | +(3%H+1.5) |
Two-points calibration (um) (H is the actual thickness of the measurement object) | ±[(1-3)%H+1] | [(1-3)%H+1.5] | |
Test conditions | Minimum radius of curvature (mm) | Convex 3 | Convex 3 |
Diameter of minimum area (mm) | Ø7 | ||
Critical thickness of matrix (mm) | 0.5 | 0.3 |